EPI inspection (pits, scratches, carrots, etc.); inspection through all of the steps of your process.
Probe Mark Inspection, Bump Inspection, CD, Overlay, and Post-Dice Inspection, all with the same
system. An Advanced 3D Optical Profiling solution with precise step height and roughness
measurements.
Back End solutions for the most advanced applications. High Accuracy, High Speed Die Bonding to
basic flip chip bonding; Wire bonding with tightly controlled loop and length parameters, as well as,
basic systems for ball and wedge bonding with advanced capabilities only the automated systems
have. Then, test the bonds using the most advanced bond tester on the market.
devices electrically at DC or RF frequencies or environmentally at extreme temperatures.
Failure Analysis solutions for SEM or TEM preparation. Acoustic Microscopy solutions for
nondestructive failure analysis, process development, R&D, High-Rel qualification, or low/medium-
volume screening. Decapsulation systems with precise software control over the entire process and
Laser Cutting systems for a variety of materials.
Automation solutions for Wafer Sorting and Stocking, Reticle Storage, and Storage Container, SMIF
and FOUP Cleaning.
CWI provides the highest quality solutions at every step of the semiconductor device fabrication
process..