METROLOGY & INSPECTION

_WVN2792FF.jpg
  • 2D or 3D

  • Wafer, Diced on Frame, Substrates, Modules, Wire Bonds, PCB

Automated Optical Inspection

KLA
  • Transparent or Opaque

  • Smooth to Rough

  • Low to High Reflectivity

  • Sub-nm to mm

Optical Profilers

KLA
  • Step Height

  • Roughness

  • Bow & Stress

  • R&D and Production

Stylus Profilers

Trench.png
  • Ultra Thin & Thick Films

  • Multi-Layer Films Stacks

  • Depth, CDs, Profiles

Film Thickness/Trench Depth

Screen Shot 2018-12-24 at 8.08.33 AM.png
  • Trace Elemental Surface Contamination

  • Metal Film Metrology

X-Ray Metrology

PCB.png
  • -50C to +300C

  • 600mm x 600mm

  • CTE & Strain Analysis

Warpage Metrology

CALL US

Tel: 732-536-3964

 HOURS

Mon - Fri: 8am - 6pm

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

© 2023 by Dr. Repair. Proudly created with Wix.com