Metrology > Film Thickness 

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Metrology Systems

 

SEMICONDUCTOR INDUSTRY

EclipSE

The EclipSE utilizes n&k’s patented optical design that combines single wavelength ellipsometry with polarized DUV-Vis-NIR reflectometry to determine the optical properties and thicknesses of ultra-thin (less than a few nm) and thick films and multilayer film structures, plus depths, CDs, and profiles of complex trenches and holes.

Olympian Series

The n&k Olympian Series is a DUV-Vis-IR scatterometer/thin film metrology system with micro-spot technology, covering the wavelength range from 190nm – 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&k’s DUV-Vis-NIR scatterometer series – the OptiPrime-CD Series.

OptiPrime-CD Series

The OptiPrime-CD series are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements from 190nm–1000nm, with micro-spot technology.

LittleFoot-CD Series

The LittleFoot-CD Series are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. 

TF Series

The OptiPrime-TF, OptiPrime-TF-M and LittleFoot-TF are DUV-Vis-NIR thin film only metrology systems, based on unpolarized Reflectance (R) measurements from 190nm to 1000nm with microspot technology.

 

PHOTOMASK INDUSTRY

Gemini Series

The Gemini and Gemini-M are DUV-Vis-NIR (Wavelength Range: 190nm – 1000nm) Scatterometers/Thin Film Metrology Systems specifically designed for measurements of Conventional and EUV photomasks.

Gemini TF Series

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

 

DATA STORAGE INDUSTRY

Disk Metrology : 1500-D

The 1500-D measures unpolarized reflectance (R) to determine the optical properties (n and k) from 190nm – 1000nm, and thicknesses of thin films, in particular diamond-like carbon (DLC) and magnetic layers, comprising hard disks.

 

FLAT PANEL DISPLAY INDUSTRY

Gemini TF Series

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

 

SOLAR INDUSTRY

Gemini TF Series

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

CALL US

Tel: 732-536-3964

 HOURS

Mon - Fri: 8am - 6pm

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

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