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Test & Measurement > Test Sockets

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Products

 

Pad Series 

Test Contactors

Johnstech’s patented ROL® technology offers the best-in-class electrical performance for testing your most demanding RF/microwave communications devices to 40 GHz.

  • Consistent contact resistance

  • Reliable and repeatable results

  • Higher first pass yield

Consistent Contact Resistance

Reliable and Repeatable Results

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Higher First Pass Yield

Improved OEE

Consistent Contact Resistance

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Less Frequent Cleaning

Leaded Series 

Test Contactors

Johnstech’s patented ROL® technology brings excellent electrical performance and proven mechanical reliability for Precision Analog, Mixed Signal and RF device testing.

  • Consistent contact resistance

  • Improved OEE

  • Less frequent cleaning

 

XT Series 

Test Contactors

Johnstech® XT™ Contactors include a family of test solutions that have been uniquely designed for consistent and stable tri-temp testing reliability. They include unique and proprietary, housing and elastomer combinations approved for automotive device testing for temperature ranges from -65°C to +175°C. While primarily focused on automotive applications, XT™ Contactors are ideal for all high or low temperature testing applications.

  • Reliability improves yield

  • Mechanically robust

Reliability Improves Yield

Mechanically Robust

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Precision Measurements

Repeatable Results

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Low Maintenance

BGA Series 

Test Contactors

Johnstech offers BGA series test sockets and contactors for semiconductors and integrated circuit (IC) boards with the highest electrical and mechanical performance on the market.

  • Precision measurements

  • Repeatable results

  • Low maintenance

 

IQtouch WLCSP Series 

Probe Array

Delivering unsurpassed low and stable contact resistance (CRES) by optimizing among several critical engineered parameters, including effective probe signal transmission path.

  • Lowest CRES

  • Increase yields, less retest

  • Stable, accurate test signals

Low CRES

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Increase Yields, Less Retest

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Stable, Accurate Test Signals

 

Reduced Edge Rate Degradation

Superior Electrical Performance

Less Noise Incursion

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Memory Module Series

Test Contactors

Johnstech’s patented Edge technology exceeds the testing challenges of today’s low-voltage (1.05-1.8 VDC, 2133-3200 MHz, 3200 MT/S), DDR4 Memory Modules.

  • Reduced edge rate degradation

  • Less noise incursion

  • Superior electrical performance

 
CALL US

Tel: 732-536-3964

 HOURS

Mon - Fri: 8am - 6pm

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

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