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Test & Measurement > Test Handlers
SEMICONDUCTOR & SENSOR TEST
MEMS & SMART Sensor Test Handlers
Structured Light 3D Sensor
Test Handler
Designed to solve the complex test of projector light while addressing the human eye safety concerns.
Flexi Configuration Test Handler
Offers dual configurations for both input and output which can accommodate both lead and leadless packages.
Optical Lens Test Handler
Offers a full turnkey solution that performs a wide spectrum of tests onto Optics/DOE Lens.
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Time of Flight 3D Sensor Handler
Offers full turnkey solution to test TOF 3D sensors, solving the challenges encountered after the sensors are produced.
Wafer-Level VCSEL/LED Burn-In Handler
Designed to test probe and burn-in packages. Capable of testing up to 7,200 DUTs in one pass with controlled temperature up to 135°C.
Spectrum Sensor Test Handler
Designed to simulate real life tests onto Spectrum Sensors in both electrical and optical characteristics.
Ambient Light Sensor Calibration & Test Handler
Tunable light source use in this handler is capable of providing uniform light from 300nm to 1100nm at 2nm steps or smaller for calibration.
MEMS Microphone Test Handler
Features wafer input, electrical / functional test, 6-sided vision inspection, sorting and tape & reel specifically designed for MEMs microphone.
Proximity Sensor Test Handler
Tests performance of proximity sensors using Advanced Optical Chambers which are configurable for distances from 0mm to 50mm
MEMS Motion Sensor Test Handler
This motion sensor tester is capable of running high parallel tests up to 72 sites and offers soft handling capability.
Vision Inspection Handlers
PM35/PM35IP Tube to Tube Integrated Vision Handler
High speed turret handler for test and inspection of thin devices. Accommodates for tube input to tube output with auto sorting capability.
PM3590TT Tray to Tray Integrated Vision Handler
This turret base vision inspection handler accommodates for JEDEC tray input to JEDEC tray output with auto sorting capability.
PM36VI Bowl to Bucket Integrated Vision Handler
A top performer featuring low initial investment, state-of-the-art vision inspection capabilities, quick set up and high throughput.
PM42ST/DT Reel to Reel Vision Inspection Handler
Designed to fully automate post seal vision inspection of reel to reel output. Provides fast & consistent output with high inspection accuracy.
Vision Integration - Genesis
Genesis brings exceptional simplicity and flexibility to inspection applications across all manufacturing industries.
Power Module Test Handler
Provides capability of high voltage/current testing. Targets on power device such as IPM and IGBT.
LED & BURN-IN TEST SOLUTIONS
End Product Test & Tune Solutions
Auto Leak Test
Used for precise measurement and control of airflow of device under test. Measures air leak rate automatically prior to tuning and testing.
End Product Test System
This equipment is used to test the performance of hair dryers with predetermined specifications.
Digital Tune & Test System
Used to control the air flow rate, humidity, temperature, power, current and voltage, to simulate particular working conditions.
LED Burn-In Test
LED Test & Burn-In Handler
Used to perform burn-in tests on certain types of LED products under a high temperature and current to select and phase out items of early mortality
LED Burn-In Over System
Used to perform burn-in tests under high humidity, temperature and current, to monitor product performance reliability.
Constant Current Rack/Module
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Configurable constant current source to individual DUT
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Continuous mode: 100mA - 1500mA max
LED Handler / Sorter
PM1800
A new gravity feed handler capable of orientation inspection, marking, dim and open/short test together with full features and functions.
PM2800
This new LED sorter machine features pick and place process from Mylar ring frame to test nest and more.
PM3300
This new rotary turret test, 64/128 bins handler processes a wide spectrum of packages and features dynamic binning and soft handling.
VCSEL Burn-In Test
VCSEL Burn-In Test
Performs burn-in tests on LEDs and wafers under a high temperature, humidity or voltage, to find early defects.