Probe Stations

• MPI Corporation

• Manual, Semi-auto, Fully-auto

• Shielded or Thermal

• 50 mm to 300 mm

Thermal Forcing Systems

• -100° to +300°C

• Tabletop to Production

• Quiet & Eco-Friendly

Tuners

• Load Pull

• Noise Figure

• Pulsed IV

Thermal Platforms

• -100° to 200°C

• Banchtop or Rack Mounted

• LN2, LCO2 or Mechanical

Thermal Chambers

• -185° to +500°C

• Transition Rates up to 100°C/minute

• Various Sizes

• Customizable

Test Sockets

• SOT, QFN, BGA

• RF, mmWave, Kelvin

• Production-worthy

RF Probes

• 26 GHz to 110 GHz

• GSG, GS, SG & Multi Contact

• Small Contact Area, Low Damage

MicroPositioners

• Backlash-free

• DC, RF & mmWave

Probe Cards

• Reliability

• High Voltage

Semiconductor Test Handlers

• Leaded & QFN Packages

• Variety of Inputs & Outputs

• Inspection

Power Module

Test Handlers

• Power Device & Modules

• Variety of Package Types

• Over temperature Test

VCSEL & Sensor Handlers

• Optic & Photonic Test

• Proximity Sensor Test

• Time of Flight Test

• Image Sensor Test