TEST & MEASUREMENT

MPI

Probe Stations

  • MPI Corporation

  • Manual, Semi-auto, Fully-auto

  • Shielded or Thermal

  • 50 mm to 300 mm

T&M_Thermal Forcing Systems

Thermal Forcing Systems

  • -100° to +300°C

  • Tabletop to Production

  • Quiet & Eco-Friendly

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Tuners

  • Load Pull

  • Noise Figure

  • Pulsed IV

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Thermal Platforms

  • -100° to 200°C

  • Banchtop or Rack Mounted

  • LN2, LCO2 or Mechanical

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Thermal Chambers

  • -185° to +500°C

  • Transition Rates up to 100°C/minute

  • Various Sizes

  • Customizable

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Test Sockets

  • SOT, QFN, BGA

  • RF, mmWave, Kelvin

  • Production-worthy

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RF Probes

  • 26 GHz to 110 GHz

  • GSG, GS, SG & Multi Contact

  • Small Contact Area, Low Damage

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MicroPositioners

  • Backlash-free

  • DC, RF & mmWave

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Probe Cards

  • Reliability

  • High Voltage

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Semiconductor Test Handlers

  • Leaded & QFN Packages

  • Variety of Inputs & Outputs

  • Inspection

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Power Module

Test Handlers

  • Power Device & Modules

  • Variety of Package Types

  • Over temperature Test

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VCSEL & Sensor Handlers

  • Optic & Photonic Test

  • Proximity Sensor Test

  • Time of Flight Test

  • Image Sensor Test

CALL US

Tel: 732-536-3964

 HOURS

Mon - Fri: 8am - 6pm

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

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