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TEST & MEASUREMENT

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Thermal Platforms

  • -100° to 200°C

  • Banchtop or Rack Mounted

  • LN2, LCO2 or Mechanical

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Thermal Forcing Systems

  • -100° to +300°C

  • Tabletop to Production

  • Quiet & Eco-Friendly

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Tuners

  • Load Pull

  • Noise Figure

  • Pulsed IV

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Power Device Testers

  • Die, Wafer or Package Level

  • High Speed

  • Expandable

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Thermal Chambers

  • -185° to +500°C

  • Transition Rates up to 100°C/minute

  • Various Sizes

  • Customizable

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Amplifiers

  • Based upon state-of-the-art GaN PA modules

  • High continuous power across the band

  • High linearity for Wideband communications testing

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Semiconductor Test Handlers

  • Leaded & QFN Packages

  • Variety of Inputs & Outputs

  • Inspection

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VCSEL & Sensor Test

  • Optic & Photonic Test

  • Proximity Sensor Test

  • Time of Flight Test

  • Image Sensor Test

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Probe Cards

  • Reliability

  • High Voltage

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Factory Automation

  • Material Handling

  • Assembly Modules

  • Robotics

  • Storage Systems

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Power Module

Test Handlers

  • Power Device & Modules

  • Variety of Package Types

  • Over temperature Test

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VCSEL Burn In Systems

  • Up tp 7200 Channels

  • Programmable Duration

  • 20mA-100mA

  • Ambient - 130C