Thermal Platforms

• -100° to 200°C

• Banchtop or Rack Mounted

• LN2, LCO2 or Mechanical

Thermal Forcing Systems

• -100° to +300°C

• Tabletop to Production

• Quiet & Eco-Friendly

Tuners

• Load Pull

• Noise Figure

• Pulsed IV

Power Device Testers

• Die, Wafer or Package Level

• High Speed

• Expandable

Thermal Chambers

• -185° to +500°C

• Transition Rates up to 100°C/minute

• Various Sizes

• Customizable

Amplifiers

• Based upon state-of-the-art GaN PA modules

• High continuous power across the band

• High linearity for Wideband communications testing

Semiconductor Test Handlers

• Leaded & QFN Packages

• Variety of Inputs & Outputs

• Inspection

VCSEL & Sensor Test

• Optic & Photonic Test

• Proximity Sensor Test

• Time of Flight Test

• Image Sensor Test

Probe Cards

• Reliability

• High Voltage

Factory Automation

• Material Handling

• Assembly Modules

• Robotics

• Storage Systems

Power Module

Test Handlers

• Power Device & Modules

• Variety of Package Types

• Over temperature Test

VCSEL Burn In Systems

• Up tp 7200 Channels

• Programmable Duration

• 20mA-100mA

• Ambient - 130C