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TEST & MEASUREMENT

RF Probes
Micropositioners
Die Level Test Systems
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Probe Stations

  • Manual, Semi-Auto, Fully-Auto

  • DC, RF, High Power and Photonics

  • RF Probes and Probe Cards

  • Micropositioners

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Thermal Forcing Systems

  • -100° to +300°C

  • Tabletop to Production

  • Quiet & Eco-Friendly

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Tuners

  • Load Pull

  • Noise Figure

  • Pulsed IV

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Power Device Testers

  • Die, Wafer or Package Level

  • High Speed

  • Expandable

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Thermal Platforms

  • -100°C to +200°C

  • Benchtop or Rackmounted

  • Various Sizes

  • Customizable

  • LN2, LCO2 or Mechanical Cooling

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Amplifiers

  • Based upon state-of-the-art GaN PA modules

  • High continuous power across the band

  • High linearity for Wideband communications testing

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Semiconductor Test Handlers

  • Leaded & QFN Packages

  • Variety of Inputs & Outputs

  • Inspection

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T&M Racks

  • Test & Measurement Equipment Rack Enclosures

  • Server Cabinets

  • Colocation Cages

  • Seismic Racks

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Probe Cards

  • Reliability

  • High Voltage

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Thermal Chambers

  • -185C to +500C

  • Benchtop or Rack Mounted

  • Transition Rates up to 100°C/minute

  • LN2, LCO2 or Mechanical Cooling

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Power Module

Test Handlers

  • Power Device & Modules

  • Variety of Package Types

  • Over temperature Test

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Test Sockets &
WLCSP

  • High Frequency & mmWave

  • High Power

  • Kelvin

  • WLCSP