Probe Stations

• Manual, Semi-Auto, Fully-Auto

• DC, RF, High Power and Photonics

• RF Probes and Probe Cards

• Micropositioners

Thermal Forcing Systems

• -100° to +300°C

• Tabletop to Production

• Quiet & Eco-Friendly

Tuners

• Load Pull

• Noise Figure

• Pulsed IV

Power Device Testers

• Die, Wafer or Package Level

• High Speed

• Expandable

Thermal Platforms

• -100°C to +200°C

• Benchtop or Rackmounted

• Various Sizes

• Customizable

• LN2, LCO2 or Mechanical Cooling

Amplifiers

• Based upon state-of-the-art GaN PA modules

• High continuous power across the band

• High linearity for Wideband communications testing

Semiconductor Test Handlers

• Leaded & QFN Packages

• Variety of Inputs & Outputs

• Inspection

T&M Racks

• Test & Measurement Equipment Rack Enclosures

• Server Cabinets

• Colocation Cages

• Seismic Racks

Probe Cards

• Reliability

• High Voltage

Thermal Chambers

• -185C to +500C

• Benchtop or Rack Mounted

• Transition Rates up to 100°C/minute

• LN2, LCO2 or Mechanical Cooling

Power Module

Test Handlers

• Power Device & Modules

• Variety of Package Types

• Over temperature Test

Test Sockets &
WLCSP

• High Frequency & mmWave

• High Power

• Kelvin

• WLCSP