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ADVANCED PACKAGING SOLUTIONS

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Plasma Cleaning

  • Plasma Clean Bond Pad

  • Plasma Clean Before Bumping

  • Adhesion Improvement of Wafer Mold After Bumping

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Die Bonding

  • Semi-Automated TCB

  • Ultra-High Accuracy Die Bonders

  • Thermocompression Die Bonding

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Automated Optical Inspection

  • Pre and Post-Dice Wafers

  • Bonded Wafers

  • RDL

  • 2D or 3D AOI

  • Bump/Pillar, Dicing Inspection

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Bump Shear Test

  • Die Shear, Adhesion, Ball Pull, etc.

  • Revolving Measurement Unit

  • Automation

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Bump Reflow

  • Fluxless solder reflow

  • Flux based reflow

  • Batch and Production Reflow Systems

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Bump, Pillar, RDL

  • PVD or ECD

  • UBM for Bumping and RDL

  • Interposers, Fan-Out and TSV

  • FSM & BSM

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Pressure Curing Oven (PCO)/Autoclave

  • 2.5D and 3D Underfill Void Removal

  • NCP/CUF/DAF/FOW Curing

  • Bump Reflow

  • Warpage Suppression

  • Polyamide Curing & PBO

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Wafer Level X-Ray

  • TSV Voiding Detection

  • Bump Voiding

  • Bump Misalignment

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Advanced Packaging Metrology

  • Bow/Warp/TTV

  • Film Thickness

  • PI & Surface Roughness

  • TSV Depth, RDL Width and Height

  • Bonded Wafer Thickness

  • Overlay Metrology

Vacuum Drying
Laser Trimming
OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

© 2023 by Dr. Repair. Proudly created with Wix.com

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