top of page
Metrology Systems
Semiconductor Industry
SEMICONDUCTOR INDUSTRY
EclipSE

The EclipSE utilizes n&k’s patented optical design that combines single wavelength ellipsometry with polarized DUV-Vis-NIR reflectometry to determine the optical properties and thicknesses of ultra-thin (less than a few nm) and thick films and multilayer film structures, plus depths, CDs, and profiles of complex trenches and holes.
Olympian Series

The n&k Olympian Series is a DUV-Vis-IR scatterometer/thin film metrology system with micro-spot technology, covering the wavelength range from 190nm – 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&k’s DUV-Vis-NIR scatterometer series – the OptiPrime-CD Series.
Photomask Industry
PHOTOMASK INDUSTRY
Data Storage Industry
DATA STORAGE INDUSTRY
Flat Panel Display Industry
FLAT PANEL DISPLAY INDUSTRY
Solar Industry
SOLAR INDUSTRY
bottom of page