top of page
n&k_logo.png

Metrology Systems

Semiconductor Industry

SEMICONDUCTOR INDUSTRY

OptiPrime-X
n&k_eclipse.jpg

The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.

​

Olympian Series
n&k_Olympian.jpg

The n&k Olympian Series is a DUV-Vis-IR scatterometer/thin film metrology system with micro-spot technology, covering the wavelength range from 190nm – 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&k’s DUV-Vis-NIR scatterometer series – the OptiPrime-CD Series.

OptiPrime-CD Series
n&k_OptiPrime-CD.png

The OptiPrime-CD series are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements from 190nm–1000nm, with micro-spot technology.

LittleFoot-CD Series
n&k_littlefoot.png

The LittleFoot-CD Series are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. 

TF Series
n&k_tf-series.png

The OptiPrime-TF, OptiPrime-TF-M and LittleFoot-TF are DUV-Vis-NIR thin film only metrology systems, based on unpolarized Reflectance (R) measurements from 190nm to 1000nm with microspot technology.

Photomask Industry

PHOTOMASK INDUSTRY

Gemini Series
n&k_gemini.png

The Gemini and Gemini-M are DUV-Vis-NIR (Wavelength Range: 190nm – 1000nm) Scatterometers/Thin Film Metrology Systems specifically designed for measurements of Conventional and EUV photomasks.

Gemini TF Series
n&k_gemini_tf.png

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

Data Storage Industry

DATA STORAGE INDUSTRY

Disk Metrology : 1500-D
n&k_DataStorage_1500-D.png

The 1500-D measures unpolarized reflectance (R) to determine the optical properties (n and k) from 190nm – 1000nm, and thicknesses of thin films, in particular diamond-like carbon (DLC) and magnetic layers, comprising hard disks.

Flat Panel Display Industry

FLAT PANEL DISPLAY INDUSTRY

Gemini TF Series
n&k_gemini_tf.png

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

Solar Industry

SOLAR INDUSTRY

Gemini TF Series
n&k_gemini_tf.png

The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates.

OVER 40 YEARS EXPERIENCE
PRODUCTS
VISIT US

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

© 2023 by Dr. Repair. Proudly created with Wix.com

bottom of page