TURNKEY RELIABILITY TEST INSTRUMENTS
AARTS Product Line
Designed to stress devices with RF, DC, and thermal stimulus. Stimulates each DUT with:
Independent RF drive level for each DUT
Frequency ranges to 77GHz and RF input up to 50W
Designed to maximize channel density. Stimulates each DUT with:
Two independent bias sources (up to 100V, 4A at 200W max)
Bias can be constant voltage or constant current sources
Power Device Reliability Systems
mm-Wave Reliability Systems
mm-Wave AARTS Systems
The millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
BURN-IN TEST SYSTEMS
Turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation.
RF/Microwave Test Fixtures
The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture.
Standard RF Fixture
Supports both pulsed and non-pulsed operation and employs SMA input/output connections. For RF output powers over 10W, an N-type connector may be used to replace the SMA connector because of its power-handling capability.
Designed for operation at very high-frequencies. A variety of models cover 20GHz to 94GHz. Waveguide input is converted to a planar (microstrip) waveguide inner area.
Dual-Device DC Fixture
The dual-device DC fixtures work with systems that provide DC and thermal stimulus only to the device. There are no RF signals available. This option provides the most channel density of any fixture.
The Multi-Function fixture offers the ability to route multiple RF and DC channels into one device. Hence, MMICs and other module-like devices that require more than just two power supplies may be tested.
RF-Ready DC Fixture
The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus.
Benchtop Test Platforms
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem.