High Speed Tuners
Impedance Tuners
Fundamental Wideband Tuners
0.1 GHz to 120 GHz
Discover Focus Microwaves' wideband fundamental tuners. The C-Series (Computer-Controlled Microwave Tuners) feature one to three wideband probes, enabling exceptionally broad frequency coverage—ideal for high-power and wideband noise applications.
Designed for precision, the tuner's long-lasting RF probes ensure optimal tuning accuracy while eliminating spurious resonances. The integration of multiple probes within a single tuner provides ultra-wideband coverage, making it a versatile solution for demanding RF applications.
Harmonic Wideband Tuners
0.2 to 120 GHz
Focus Microwaves’ Harmonic Tuners (MPT) were developed in 2004 in response to customer demand for advanced impedance control tools. These tuners operate across a wide frequency range (0.2 to 120 GHz) and are essential for nonlinear device characterization and power amplifier design.
Waveguide Wideband Tuners
8 GHz to 330 GHz
Discover the frontier of tuner technology with Focus Microwaves' new waveguide tuners, designed for frequencies exceeding 110GHz. Combining the success of DELTA and omega tuners, these instruments promise to revolutionize Sub-THz bands, offering a high tuning range in a compact footprint. With extreme precision and low-loss RF probes, these tuners ensure optimal accuracy and repeatability, setting a new standard in on-wafer applications.
Low Frequency Tuners
1.5 MHz to 170 MHz
The Low Frequency Tuner (LFT) is a unique product technology using M algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors. The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
Manual Wideband Tuners
0.4 GHz to 18 GHz
Discover Focus Microwaves' versatile MMT series of manual tuners, offering octave and multi-octave bands from 400MHz to 18GHz. With the same RF technology and precision as our automatic tuners, they ensure high VSWR at the DUT reference plane for reliable performance. Enhance harmonic tuning with options -H2 and -H23, inspired by our harmonic rejection tuners (PHT). Experience precision in manual tuning with Focus Microwaves.
HIGH SPEED LOAD PULL
DLP Active Load Pull System and Rapid Digital Tuner
Active load pull tuning is essential for overcoming the limited tuning range of passive tuners, which is further reduced by fixture and probe insertion loss.
Using two or more synchronized (coherent) sources enables open-loop active and harmonic tuning by closing the loop at IF through synchronization, rather than at RF.
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Single-tone CW & pulsed-CW RF signal
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DC & pulsed-DC bias
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Time-domain NVNA voltage & current waveforms & load lines
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Frequencies from 1 MHz & beyond 40 GHz
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Pulsed S-parameters (Pulsed DC and Pulsed RF)
VECTOR-RECEIVER LOAD PULL MEASUREMENTS
THERMAL PLATFORMS / PLATES
Focus Microwaves’ RAPID digital tuner technology is now available for very wideband communication signals, supporting the latest 5G FR1 and IEEE 802.11ax standards. This new architecture leverages the raw performance of National Instruments PXIe-5842* PXI Vector Signal Transceiver. The Rapid VT, utilizes two PXIe-5842 VST 3’s to make a VNA architecture with up to 1GHz active load pull bandwidth capability. The system solution provides a flexible load pull test platform that can be used to test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax but can also be configured for fast load pull and s-parameter measurements. This opens up the possibility of using this system in all parts of the design cycle, from initial device characterization, to MMIC or PA design, design verification testing and ultimately to product testing in the factory.
ACTIVE / HYBRID LOAD PULL
Active Load Pull
Active load pull systems, which operate by injecting signals directly at the Device Under Test (DUT) plane, have the capability to synthesize high reflection coefficients. By actively compensating for the inherent losses present in passive tuning techniques, active load pull systems can effectively overcome limitations and provide full Smith chart coverage. This ability to generate high reflection coefficients allows for a more comprehensive exploration of the impedance matching conditions across the Smith chart, enabling engineers to optimize the performance of RF circuits and devices.
Hybrid Passive-Active Load Pull
A hybrid load pull system combines the features of both active and passive tuning techniques to offer a versatile and efficient solution for impedance tuning in RF testing setups. By integrating an active loop with passive tuners, hybrid load pull systems can leverage the benefits of both approaches.
NOISE FIGURE / NOISE PARAMETER MEASUREMENTS
Introduction
Focus Microwaves’ noise parameter measurement system provides a solution to extract accurate noise parameters of a device under test (DUT): minimum noise figure, equivalent noise resistance and optimum noise reflection factor (Gamma and phase). The measurement system is designed to accommodate both connectorized and bare die devices, while offering fast, precise and stable measurements.
Ultra-Fast Noise Parameters
The noise measurement system, along with its dedicated software (Requires option NPEx), is specifically optimized for the system calibration, DUT measurement, and DUT noise parameters extraction.
PULSED-BIAS PULSED-RF HARMONIC LOAD PULL
Pulsed Measurements
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Pulsed Load Pull
The use of pulsed stimulus signals in characterizing high-power non-linear devices offers several advantages over continuous wave excitation. Continuous wave excitation can lead to issues such as self-heating and memory effects which can severely impact device performance. By employing pulsed signals, devices can be characterized at higher peak power levels up to saturation, mimicking real-world operating conditions more accurately while reducing the risk of device breakdown and providing better control over operating temperature.
Pulsed stimulus signals are particularly beneficial for applications such as RADARs where device operation in pulses is more common and representative of actual usage scenarios.
